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一种宽温域介电常数的无损光学测试方法及系统
Release Time:2024-09-03
  • Institution:
    前沿交叉科学青岛研究院
  • Type of Patent:
    Invent
  • Application Number:
    202211540091.9
  • Number of Inventors:
    2
  • Service Invention or Not:
    No
  • Application Date:
    2022-11-30
  • Publication Date:
    2024-08-23
  • Authorization Date:
    2024-08-23
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