Patents
一种用于有源阵列天线幅相测试的可调探头阵列
    Release Time:2021-09-29| Hits:
 
    
   Title:一种用于有源阵列天线幅相测试的可调探头阵列
   Institution:信息科学与工程学院
   Type of Patent:Invent
   Application Number:202010847551.7
   Number of Inventors:2
   Service Invention or Not:No
   Publication Date:2021-08-27
   Authorization Date:2021-08-27
   Release Time:2021-09-29
  
Copyright All Rights Reserved Shandong University Address: No. 27 Shanda South Road, Jinan City, Shandong Province, China: 250100
Information desk: (86) - 0531-88395114
On Duty Telephone: (86) - 0531-88364731 Construction and Maintenance: Information Work Office of Shandong University