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一种用于有源阵列天线幅相测试的可调探头阵列
Release Time:2021-09-29| Hits:

Title:一种用于有源阵列天线幅相测试的可调探头阵列
Institution:信息科学与工程学院
Type of Patent:Invent
Application Number:202010847551.7
Number of Inventors:2
Service Invention or Not:No
Publication Date:2021-08-27
Authorization Date:2021-08-27
Release Time:2021-09-29