山东大学教师主页肖洪地 Degradation mechanism of hydrogen-terminated porous silicon in the presence and in the absence of light Home

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Degradation mechanism of hydrogen-terminated porous silicon in the presence and in the absence of light

Release Time:2019-04-14

Institution:

物理学院
Journal:

AIP Advances
First Author:

肖洪地
Document Code:

lw-174582
Volume:

5
Page Number:

067125
Translation or Not:

No
Date of Publication:

2015-05

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