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Bowen Sun, Xu Han, Ruixue Xu, Kai Qian*, "Uncovering the Indium Filament Formation and Dissolution in Transparent ITO/SiNx/ITO Resistive Random Access Memory",ACS Appl. Electron. Mater. 2020, 2, 1603−1608

发布时间:2021-01-28
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论文名称:
Bowen Sun, Xu Han, Ruixue Xu, Kai Qian*, "Uncovering the Indium Filament Formation and Dissolution in Transparent ITO/SiNx/ITO Resistive Random Access Memory",ACS Appl. Electron. Mater. 2020, 2, 1603−1608
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发布时间:
2021-01-28