Paper Publications
Three-Dimensional Nondestructive Characterization of Extrinsic Frank-Type Stacking Faults in 4H-SiC Crystals
Release Time:2025-02-18
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Institution:
光学高等研究中心
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Journal:
CRYSTAL GROWTH & DESIGN
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Document Code:
1869668689585999874
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Number of Words:
8
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Translation or Not:
No
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Date of Publication:
2024-12