Yifei Philip Zhang
Professor
Visit:次
Patents
Home
一种使用暗场光学成像技术判别二维材料层数的方法
  • Title:
    一种使用暗场光学成像技术判别二维材料层数的方法
  • Institution:
    集成电路学院
  • Type of Patent:
    Invent
  • Application Number:
    202211106087.1
  • Number of Inventors:
    4
  • Service Invention or Not:
    No
  • Application Date:
    2022-09-09
  • Publication Date:
    2023-10-31
  • Authorization Date:
    2023-10-31
  • Release Time:
    2023-11-01
Copyright All Rights Reserved Shandong University Address: No. 27 Shanda South Road, Jinan City, Shandong Province, China: 250100
Information desk: (86) - 0531-88395114
On Duty Telephone: (86) - 0531-88364731 Construction and Maintenance: Information Work Office of Shandong University